Nonlinear Optical Technique for Precise Retardation Measurements

We present a highly sensitive nonlinear optical technique to measure optical retardation. The technique is based on second-harmonic generation from thin films using two beams at the fundamental frequency. The sensitive polarization dependence of the process allows measuring optical retardation very precisely. The technique relies on fundamental symmetry principles and does therefore not require complicated experimental arrangement or data analysis. The technique was demonstrated by determining the retardation of a nominal half-wave plate to a precision and repeatability better than lambda/10(4).