A simplified ultra-high-vacuum scanning-tunneling-microscope (UHV-STM) was developed. The UHV-STM can be mounted through a 35-mm i.d. flange in arbitrary spatial orientation. It is thermally well-compensated and highly insensitive to vibrations. The scanner provides atomic resolution capability as well as a large scan range of 7×7 μm. The UHV-STM is driven by unmodified ‘‘Nanoscope 2’’ electronics. Samples as well as tips are exchangeable via an airlock system. Topographic images of the 7×7 reconstruction on Si(111) and of micron-size Au islands on Si(111) are shown.
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Schmid et al. (1991) studied this question.