Arrays of InP-based avalanche photodiodes (APDs) with InGaAsP absorber regions have been fabricated and characterized in the Geiger mode for photon-counting applications. Measurements of APDs with InGaAsP absorbers optimized for 1.06mum wavelength show dark count rates (DCRs)<20 kHz, PDE up to 45%, and a reset time of ~6mus. Arrays for both wavelengths have been fabricated and packaged with GaP microlenses (of 100 and 50 μm pitch) and CMOS readout integrated circuits (ROICs). Comparisons are made between ROICs that operate in the framed-readout mode as well as those that operate in continuous-readout mode.
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Verghese et al. (2007) studied this question.
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