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February 10, 2001Analytical Chemistry

Desorption−Ionization Mass Spectrometry Using Deposited Nanostructured Silicon Films

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Authors

JCJoseph D. CuiffiPennsylvania State UniversityDHDaniel J. HayesPennsylvania State UniversitySFStephen J. FonashUniversité Claude Bernard Lyon 1

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Cuiffi et al. (2001) studied this question.

synapsesocial.com/papers/6a95be7730f6c699df420d84https://doi.org/10.1021/ac001081k
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