The excitation and decay mechanisms of the Yb 3+ intra-4f-shell emission are studied in n-type MOVPE-grown and p-type LPE grown InP:Yb layers by photoconductivity measurements, time-resolved photoluminescence, photoluminescence excitation and emission spectroscopy. Assuming a pseudo-donor or pseudo-acceptor-like character of the isoelectronic Yb 3+ T d centre the temperature dependences of the 4f-shell transition intensity and lifetime can be consistently explained. Models for the excitation and decay processes of the Yb 3+ photoluminescence are proposed.
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Thonke et al. (1990) studied this question.
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