Ten genetic sets of grain sorghum (Sorghum bicolor L. Moench) each consisting of two pure lines, their F1, F2, and first backcrosses were studied at two locations in two years. Of characteristics observed, grain yield showed the highest heterosis [(F1—better parent)(100)/better parent] as averaged over the 10 sets and likewise had the greatest inbreeding depression [(F1—F2) (100)/F1]. Heterosis was low for plant height and negative for days‐to‐first‐bloom and kernel weight. Narrow sense heritability estimates, for the F2 generation, varied among sets. The estimates for days‐to‐first‐bloom, plant height, and kernel weight were relatively high. In contrast, grain yield had low heritability. Expected genetic advance in F3 yield under selection, was higher than actual advance for most sets, suggesting epistasis.
No takes yet. Share an insight, caveat, or question.
Liang et al. (1972) studied this question.