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A solar cell fabricated on a p-type polycrystalline Si wafer has been irradiated with a chopped photon beam emitted by a light-emitting diode. The wavelengh of the beam is 559 nm. The chopping frequency of the beam is varied from 10 to 10,000 Hz, and a cut-off frequency of 130 Hz is obtained from the frequency dependence of the ac photovoltage, which is measured capacitively through a 15 µm-thick mylar film. The observed value agrees well with that obtained by the conventional method.
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Munakata et al. (1981) studied this question.
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