The composition of n- and p-type CdTe surfaces before and after chemical modification by Ru have been examined using X-ray photoelectron spectroscopy (XPS). While the chemically etched unmodified surfaces were found to be covered by a thin layer of oxide due to ambient oxidation of a Te layer, Ru-modified surfaces were found to have a thicker oxide layer of composition TeO x where x=1.97 and 2.07 for p- and n-CdTe respectively. The Cd:Te ratios of the surfaces were determined from the peak intensities and showed depletion of Cd due to modification. These results can be related to the increase in band-bending at the surface due to Ru modification and the increase in minority carrier diffusion lengths on both p- and n-CdTe.
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Bose et al. (1989) studied this question.
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