A charge compensation system, based on a pulsed lowenergy electron flood source, designed for the 1X23S time‐of‐flight secondary ion mass spectrometry (TOFSIMS) instrument is described. Its performance in the non‐imaging mode is illustrated by spectra from polytetrafluoroethene (PTFE). High‐resolution (∼1 pm) imaging of challenging insulating samples under near‐static SIMS conditions is demonstrated for the first time.
No takes yet. Share an insight, caveat, or question.
Briggs et al. (1990) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: