Atomic force microscopy using single-wall C nanotube probes

We examine the factors that govern the stability and resolution of atomic force microscopy (AFM) using single-wall C nanotubes as imaging probes. Nonvertical alignment of the nanotubes with respect to the sample surface causes such probes to bend in response to the surface–nanotube interaction forces during imaging. For long nanotubes this bending response causes the nanotube tip to jump into contact with the surface and renders it unsuitable for imaging. For short nanotubes, stable noncontact-mode imaging can be achieved using a small cantilever vibration amplitude. In such cases it is possible to achieve lateral resolution that is comparable to the diameter of the nanotube.