Analysis of Electric Field Induced Deformations in a Nematic Liquid Crystal for any Applied Field

For the first time, expressions are presented which enable us to calculate the reorientation of the nematic director under the influence of an applied voltage of any magnitude. The mathematical techniques developed are extended to study the capacitance of a nematic layer under any magnitude of applied voltage. The calculation of the capacitance of the nematic layer up to high applied voltages allows the identification of a new high voltage linear relationship between capacitance and applied voltage. This new linear relationship has potential for enabling the anisotropic dielectric permittivity of liquid crystal materials to be measured experimentally with more accuracy and ease than before.