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An ellipsometer which provides the determination of optical properties of a thin film on the microscopic area of a specimen has been developed. Using this ellipsometer the thickness and optical constants of passive films on individual grains in the microstructure of a 22Cr‐10Ni austeno‐ferritic stainless steel have been measured in situ in p H 6.0, under potentiostatic control. It has been found that the films on α grains are thicker than those on γ‐grains in both the passivity and the transpassivity regions. The variation in film thickness from grain to grain has also been measured. Significant differences in film thickness exist at α/γ phase boundaries. The film thickness varies even among grains of the same phase. Passive films on γ‐grains are found to be thinner but more corrosion resistant than those on α grains.
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Sugimoto et al. (1983) studied this question.
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