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The properties of magnetostatic surface wave (MSSW) devices are disturbed by the finite length of the YIG film. Such disturbances, causing interference phenomena of MSSW reflected from both film ends, can be measured in the time domain by multiple reflections or in the frequency domain by a passband ripple. These reflections can be eliminated by adequately loading the film ends with semiconductive samples.
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Krug et al. (1983) studied this question.
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