Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy

This article presents the development of a faster control loop for oscillation amplitude regulation in tapping mode operation of atomic force microscopy. Two techniques in relation to actuation and measurement are developed, that together significantly increase the bandwidth of the control loop. Firstly, magnetic actuation is employed to directly control the tip position of the cantilever to improve both the speed and the dynamics of the positioning system. Secondly, the signal path for oscillation amplitude regulation is separated from that for topography estimation in order to eliminate measurement delay that degrades the performance of the feedback loop. As a result, the phase-crossover frequency and gain margin of the control system are both increased, leading to a faster and more stable system. Two experiments are performed, one in air and the other in aqueous solution, to compare the developed control system with a commercial one and demonstrate the improvement. The results verify that the combination of the two techniques along with other existing methods eliminates all limitations associated with the instrument for the purpose of oscillation amplitude regulation, which is therewith dictated by the bandwidth of the cantilever.