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We show with the help of simulations that the critical current densities determined from magnetization and transport measurements are modified differently by the presence of macroscopic defects in a superconducting flat conductor like thin film or tape. A particular double-slot geometry, reminiscent of a superconducting tape with transversal cracks, is considered for the simulations, allowing us to analyse systematically how the critical current densities determined in an inductive and transport way change as a function of the size and relative position of the defects within the tape. The differences in the critical current densities obtained from both methods are discussed.
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Bartolomé et al. (2005) studied this question.
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