Investigation of the XPS Valence Band Structure from Sn Chalcogenides

XPS valence band spectra reflect the electronic density of states weighted with cross‐sections. The spectra will give additional information about the symmetry of the electron wave function, if they are measured in dependence on the electron emission angles. Valence band spectra of SnS, SnSe, SnTe, and SnS2 are measured partly in dependence on the polar angle θ. These measurements allow an identification of the symmetry of valence orbitals from intensity variations of the valence band maxima.