Answers are grounded in this paper and cite their sources.
An electron microscopic study of the oxide films formed on niobium permits the apparently anomalous oxidation rate behavior of niobium to be explained in terms of the formation of small, blister‐like cracks in the oxide film. An oxidation model, based on the idea that an oxidation process which is maintained by interstitial‐anion or anion‐vacancy diffusion leads to the generation of stresses in the oxide film, is proposed to account for these results. The observation of similar blister‐like cracks in oxide films on tantalum is also reported.
No takes yet. Share an insight, caveat, or question.
Cathcart et al. (1958) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: