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May 15, 1982Applied Physics Letters

Raman measurements of stress in silicon-on-sapphire device structures

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Authors

SBS. R. J. BrueckID Genomics (United States)BTB-Y. TsaurMIT Lincoln LaboratoryJFJohn C. C. FanChestnut Hill College

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Brueck et al. (1982) studied this question.

synapsesocial.com/papers/6a968d78c00de92d9bfbc0c9https://doi.org/10.1063/1.92939
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