A diffraction grating mounted in the electron beam focal region of a scanning electron microscope has been used to produce superradiant emission over the 300--900 μm wavelength range. Feedback is provided by the grating itself and the electron beam is focused and positioned over the grating by the microscope's electron optical system. Extensions of this technique promise a new tunable, coherent, cw source for the difficult to access far infrared (30--1000 μm) range of the spectrum.
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Urata et al. (1998) studied this question.
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