Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
January 15, 1985Physical review. B, Condensed matter

Determination of epitaxial overlayer structures from high-energy electron scattering and diffraction

View Full Paper
Ask AI
Bookmark
Share

Authors

EBE. L. BullockCFC. S. FadleyLinköping University

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Bullock et al. (1985) studied this question.

synapsesocial.com/papers/6a96ed0233d7b00ae7bba741https://doi.org/10.1103/physrevb.31.1212
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1The growth and structure of thin copper films on (001) surfaces of nickel1975 · 55 citations
  2. 2Growth morphology determination in the initial stages of epitaxy by XPS1984 · 44 citations
  3. 3Adsorbate core-level azimuthal photoelectron diffraction at intermediate energies of 230-900 eV: Grazing emission with polarization dependence1984 · 21 citations
  4. 4Determination of Adsorbate Geometries from Intramolecular Scattering in Deep-Core-Level X-Ray Photoemission: CO on Ni(001)1979 · 151 citations