Topographical evolution of 100 MeV Au8+-ion-irradiated InP surfaces was studied using atomic-force microscopy (AFM). The surfaces were roughened under dense electronic excitations. Root-mean-square roughness measured from AFM studies showed an exponential saturation behavior with fluence. Sample temperature during irradiation was found as a parameter to control the amount of roughness on the surface and the evolution of irradiated surface topography is discussed in terms of thermal spike model.
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Singh et al. (2001) studied this question.
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