X-ray vibrational studies on (100)-oriented CdTe crystals as a function of the temperature (8–350 K)

The integrated intensities of the (h,0,0) Bragg reflections of a CdTe single-crystal wafer have been measured at 0.546±{}0.001 A{} x-ray wavelength from the white spectrum of a tungsten anode and at 1.281? A{} (W Lβ₁ excitation line). Their temperature dependences have been determined between about 8 and 360 K and analyzed with the Debye and the one-particle potential models. It is shown that the (2,0,0), (6,0,0), and (10,0,0) reflections have temperature behaviors similar to those in InSb. Furthermore, the present experimental rms atomic vibrational amplitudes are significantly higher than those predicted by some lattice-dynamical calculations.