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Although accurate depth-migration is essential for the correct geometrical interpretation of deep reflection data, migration by the standard numerical methods has generally not been satisfactory. The alternative method presented in this paper provides an efficient migration for deep reflection profiles in the form of a digitized line-drawing assuming a general, 2-D velocity structure. Migration of a digitized line-drawing reduces the effects of low signal/noise ratios. The calculation is rapid allowing migrations to be calculated for a large number of alternative velocity structures and iterative improvement of the velocity structure. The migration has been applied to 3-D structures observed on intersecting profiles collected by BIRPS (British Institutes Reflection Profiling Syndicate).
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B. Raynaud (1988) studied this question.
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