AlGaN-based back-illuminated solar-blind ultraviolet (UV) p—i—n photodetectors (PDs) with high quantum efficiency are fabricated on sapphire substrates. To improve the overall performance of the PD, a series of structural design considerations and growth procedures are implemented in the epitaxy process. A distinct wavelength-selective photo-response peak of the PD is obtained in the solar-blind region. When operating in photovoltaic mode, the PD exhibits a solar-blind/UV rejection ratio of up to 4 orders of magnitude and a peak responsivity of ∼113.5 mA/W at 270 nm, which corresponds to an external quantum efficiency of ∼52%. Under a reverse bias of −5 V, the PD shows a low dark current of ∼1.8 pA and an enhanced peak quantum efficiency of ∼64%. The thermal noise limited detectivity is estimated to be ∼ 3.3 × 10 13 cm·Hz 1/2 W −1
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Wang et al. (2012) studied this question.
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