Resolution of Semiconductor Detectors for Fission Fragments

E. L. Haines; A. B. Whitehead

doi:10.1063/1.1719921

September 1, 1965Review of Scientific Instruments

Resolution of Semiconductor Detectors for Fission Fragments

View at Publisher

Ask AI

Bookmark

Share

Ask about this paper

Answers are grounded in this paper and cite their sources.

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Eldon L. Haines, A. Bruce Whitehead; Resolution of Semiconductor Detectors for Fission Fragments. Rev. Sci. Instrum. 1 September 1965; 36 (9): 1385–1386. https://doi.org/10.1063/1.1719921 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioReview of Scientific Instruments Search Advanced Search |Citation Search

Discussion

No takes yet. Share an insight, caveat, or question.

Cite This Study

Haines et al. (1965) studied this question.

synapsesocial.com/papers/6a97555fc1837e1fb4c60833 https://doi.org/10.1063/1.1719921

View at Publisher

Ask AI

Bookmark

Share

Resolution of Semiconductor Detectors for Fission Fragments

Ask about this paper

Abstract

Discussion

Cite This Study

Resolution of Semiconductor Detectors for Fission Fragments

Ask about this paper

Abstract

Discussion

Cite This Study

Keep reading

Keep reading