A low temperature, ultrahigh vacuum, microwave-frequency-compatible scanning tunneling microscope

To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle-style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope operates at 77 and 4 K.