The use of point-contact diodes in computer circuitry has shown that diode transient response is important in circuitry employing fast waveforms. Diodes which are pulsed in the back direction from a forward-conducting state may require microseconds to attain a specified back resistance. Transient response depends on circuit impedance and operating conditions, as well as on the diodes themselves. The present lack of ready extrapolation from one transient situation to another requires different tests and criteria for the determination of diode applicability to varying situations. The development and acceptance of a limited number of broadly applicable standard pulse tests is necessary.
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Firle et al. (1955) studied this question.
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