Simulation study reveals degraded event stream quality from static IR-drop in high-resolution event-based vision sensors, highlighting the necessity of robust power grid design.
The increasing demand for high-resolution event-based vision sensors (EVS) necessitates investigating the impact of voltage deviations in power grids, which critically degrade performance in a large-scale array. This paper systematically investigates how static IR-drop affects the EVS’s behavior. Theoretical derivations explicitly link static IR-drop to key parameters, including phase margin, bias currents, event thresholds, and refractory period. Through simulations under a 1000 × 1000 resolution EVS with 25 μm pixels and 8-power supplies, results show that static IR-drop induces bias currents decay and threshold instability. Specifically, the non-uniform distribution of refractory periods caused by static IR-drop leads to a decline in the quality of event stream. The analysis provides guidelines for power grid design in high-resolution EVS, emphasizing supply voltage integrity as a pivotal factor for enhancing event stream quality.
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Cheng et al. (2025) studied this question.
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