A unified decomposition approach for fault location in switched capacitor circuits

The problem of fault diagnosis of switched capacitor circuits is considered. Our emphasis is on utilizing and extending analogue fault diagnosis techiques to incorporate the fault diagnosis of switched capacitor structures. A decomposition approach is implemented to decompose the switched capacitor circuit into smaller subcircuits. The technique locates the faulty subnetwork(s), then faulty elements within the faulty subnetwork(s) are localized. Due to the nature of switched capacitor structures, we have considered the fault diagnosis problem in both the time domain and the frequency domain.