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We propose a method for measuring the effective conductivity of copper foil using a Fabry–Perot resonator, particularly for cases in which the foil cannot be separated from the dielectric layer or when measurements must be performed with the dielectric film in place to evaluate its sealing effects. In particular, using a Gaussian beam wave formulation, the resonance frequency andQfactor are measured for both a copper foil with a rough surface and a copper foil with dielectric, and the measured effective conductivities for both are shown to agree well. This indicates that the effect of the newly added dielectric loss can be successfully removed compared to the measurement of the copper foil without dielectric.
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Yanagimoto et al. (2026) studied this question.
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