We demonstrate a new near-field technology that uses a metallic probe in an optical disk. The metallic probe is produced in a focused spot on a readout layer composed of silver oxide. However the metallic probe is not transparent to far-field light, near-field light generated around it. Therefore, a mark of less than 100 nm in length could be recorded and reproduced by detecting the scattered light around the metallic probe and the mark.
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Fuji et al. (2000) studied this question.
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