Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of nickel as a function of probing depth. Photon energies between h ν = 190 and 780 eV were used to effectively probe up to ∼ 3–7 layers ( ∼ 5–12 Å). The results show layer-dependent band dispersion of the Δ 2↓ minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.
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Kamakura et al. (2004) studied this question.
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