An evaluation of methods for preparing easily damaged cuticular surfaces of plants for scanning electron microscopy

SUMMARY Techniques were tested to ascertain the best method for preparing the surfaces of delicate plant cuticles for microscopic examination at magnifications not exceeding 10,000. Using scanning electron microscopy, comparative examinations were made of cuticles of fresh material, ambient dried, freeze dried, critical point dried, and frozen material kept at low temperature. Micrographs were compared with material examined using light microscopy which acted as a control at low magnification. Cuticles of the leaves of runner bean, Coleus and the petals of Nicotiana, showed best surface preservation and least wrinkling when frozen, held at low temperature, and examined on a cryostage.