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We present a universal deep learning method that reconstructs super-resolved images of quantum emitters from a single camera frame measurement. Trained on physics-based synthetic data spanning diverse point-spread functions, aberrations, and noise, the network generalizes across experimental conditions without system-specific retraining. We validate the approach on low- and high-density In(Ga)As quantum dots and strain-induced dots in 2D monolayer WSe2, resolving overlapping emitters even under low signal-to-noise ratios and inhomogeneous backgrounds. By eliminating calibration and iterative acquisitions, this single-shot strategy enables rapid, robust computational super-resolution for nanoscale characterization and quantum-photonic device fabrication.
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Vašinka et al. (2026) studied this question.
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