Two XUV-photon double ionization of Kr and Ar by an intense superposition of higher-order harmonics of a Ti:sapphire laser is demonstrated. The logarithm of the Kr²⁺ and Ar²⁺ signals measured as a function of the logarithm of the XUV intensity depicts a linear dependence with a slope of 1.8±0.2. Under the XUV intensities and photon energies employed, this slope value provides evidence that to the observed double ionization the direct process has a significant contribution. Applications of the above process to attosecond pulse metrology are also discussed.
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Benis et al. (2006) studied this question.
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