Stress Impact in Nd Doped Bi4Ti3O12 Thin Films

This is the authors' abstract. We don't add key points for this paper.

The variation of ferroelectric properties of Bi-layered ferroelectric thin films, Bi3.15Nd0.85Ti3O12 (BNT), under different applied stress was investigated. In the thin films, the remnant polarization (P r) increased with tensile stress, while decreased with compressive stress. On the contrary, the coercive field (E c) decreased with the stress changing from maximum compression to maximum tension. Fatigue behavior of the films was also studied, which was improved under stress compared with zero stress (free state). These observations presented clear evidence that the reorientation of domains took great effect under stress.