A beam-scanning system for a merged electron-ion beam experiment is described. This system is used to determined the horizontal and vertical beam profiles and the form factors at three different locations along the axis of the beams. Design details of the wedge-shaped scanners and the electronic circuit for obtaining beam profiles and form factors are described. The form factor derivation for merged beams is given and an expression in terms of measured quantities is derived.
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Keyser et al. (1979) studied this question.
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