Reactor neutron environments can be used to test/screen the sensitivity of unhardened commercial SRAMs to low-LET neutron-induced upset. Tests indicate both thermal/epithermal (<1 keV) and fast neutrons can cause upsets in unhardened parts. Measured upset rates in reactor environments can be used to estimate the upset rates from thermal and fast portions of arbitrary neutron spectra.
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Griffin et al. (1997) studied this question.
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