An automated frequency domain technique for dielectric spectroscopy of materials

The technique is used for measuring the dielectric properties of materials in the range from 1 MHz to 1.3 GHz is described. Modifications in the commercially available network analyser system which will permit increased accuracy and will simultaneously take into account errors arising from nonlinearities of the network analyser are also presented. The technique is demonstrated for both low- and high-loss liquids, such as carbon tetrachloride, propanol and butanol.