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We evaluate, by a random-walk method, the dielectric constant εₑ of a composite material consisting of impenetrable, spherical conducting inclusions embedded in an insulating matrix. The random-walk method permits an accurate evaluation of εₑ up to volume fractions corresponding to near to close packing of the inclusions. We compare the εₑ results for different types of random configurations with those for the simple-cubic and face-centered-cubic lattice configurations.
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Cukier et al. (1990) studied this question.
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