Electric field-induced second-harmonic generation (EFISHG) is shown to be a very powerful method for contactless sampling of high-speed electrical signals on silicon millimeter-wave devices. We present picosecond resolution EFISHG measurements of 2 GHz sinusoidal signals on a photoconductive silicon-on-sapphire antenna. We further demonstrate the application of the EFISHG technique for spatial mapping of free-running microwave signals in silicon.
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Ohlhoff et al. (1996) studied this question.