To prevent device damage through thermal runaway, conventional III–V single photon avalanche diodes (SPADs) operate in gated mode where the device is biased above breakdown only for a short gating period. Here a free-running In0.53Ga0.47As∕InAlAs SPAD with built-in negative feedback mechanism is reported. A physical model is also developed to formulate the avalanche process with negative feedback. Introducing negative feedback enables the device to possess self-quenching and self-recovering capabilities. Such devices have demonstrated free-running single photon detection at 1550nm wavelength with single photon detection efficiency of 11.5%, dark count rate of 3.3M∕s, and a self-recovery time of 60ns at 160K.
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Zhao et al. (2008) studied this question.
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