This is the authors' abstract. We don't add key points for this paper.
The authors have fabricated YBCO (or Ag)/SrTiO/sub 3//YBCO capacitors for low-frequency measurements and SrTiO/sub 3//YBCO/LaAlO/sub 3/ coplanar-waveguide end-coupled resonators for high-frequency measurements of the SrTiO/sub 3/ dielectric constant at low temperatures. From the capacitor measurements, values for the dielectric constant ranging from approximately 200 to 800 were obtained for films of various thicknesses. This behavior of the thin-film dielectric constant was found to differ from that of the bulk crystal.>
Answers are grounded in this paper and cite their sources.
No takes yet. Share an insight, caveat, or question.
Kain et al. (1993) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: