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January 1, 2001Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Field emission from ultrathin coatings of AlN on Mo emitters

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Authors

DKDong Gwon KangSeoul National UniversityVZV.V. ZhirnovSemiconductor Research CorporationRSR. C. SanwaldNorth Carolina State University

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Kang et al. (2001) studied this question.

synapsesocial.com/papers/6a99347119c7e0464f2746ebhttps://doi.org/10.1116/1.1340669
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Also Consider

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  3. 3Space-Charge-Limited Tunnel Emission into an Insulating Film1962 · 58 citations
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  5. 5The growth and properties of Al and AlN films on GaN(0001)–(1×1)1996 · 134 citations