Implementation of reflectometry as a standard density profile diagnostic on DIII-D

The profile reflectometer system on the DIII-D tokamak has been significantly upgraded in order to improve time coverage, data quality, and profile availability. The performance of the reflectometer system, which utilizes continuous frequency modulated (FMCW) radar techniques, has been improved as follows: First, a new PC-based data acquisition system has been installed, providing higher data sampling rates and larger memory depth. The higher sampling rate enables use of faster frequency sweeps of the FMCW microwave source, improving time resolution, and increasing profile accuracy. The larger memory depth enables longer data records, so that profiles can now be obtained throughout 5 s discharges at 100 Hz profile measurement rates, while continuous sampling at 10 MHz is available for 1 s for high time resolution physics studies. Second, an initial automated between-shots profile analysis capability is now available. Third, availability of the profiles to end users has been significantly improved.