Characterization of Thermally Grown SiO[sub 2] Surfaces by Contact Angle Measurements

This paper discusses recent advances in the study of solid surfaces by contact angle measurements which appeared promising in developing a technique to characterize different types of amorphous or polycrystalline metal and oxide surfaces. The extent to which contact angle measurements and spreading‐pressure values can be used to characterize various silica surfaces is explored. A practical scheme is offered using water and an organic solvent to characterize various silica surfaces in a simple and nondestructive manner.