In this paper, an accurate method for computing the elecromagnetic field distribution in lamellar gratings is proposed. The method that relies on the rigorous coupled-wave analysis provides accurate numerical results and avoids possible sources of artefacts due to permittivity discontinuities. Its performance is analysed through various lamellar grating cases, including dielectric and metallic materials, the visible and near-infrared (1–10 μm) regions of the spectrum. Special attention is placed on field singularities which are in general present at the grating wedges for transverse magnetic polarization.
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Lalanne et al. (1998) studied this question.
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