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We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electrical ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.
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Abe et al. (2002) studied this question.
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