The application of near-edge, surface, extended x-ray absorption fine structure to the study of a clean surface is reported. Direct evidence is found for surface recrystallization of ion-damaged (amorphized) Si, whereas no such evidence is seen for evaporated (amorphous) Si. The procedures described here are applicable to almost all clean or adsorbate-covered surfaces.
No takes yet. Share an insight, caveat, or question.
Comin et al. (1985) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: