A technique for characterization of polymer blends by low voltage scanning electron microscopy is described. The method allows observation of the distribution of phases in a blend due to good topographical and compositional contrast. This is possible because of lower beam penetration and high secondary emission coefficient (δ ⩾ 1) at low accelerating voltages. Uncoated polymer samples are imaged with no charging or beam damage problems. The technique has a great advantage over conventional transmission electron microscopy techniques because the sample preparation is minimal and larger areas can be prepared for viewing.
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Vikas Berry (1988) studied this question.